Participation of academic staff in Conferences (2001)
- Mykola Blyzniuk, Olexandr Markelov Analysis of the approaches to dialogue system development and their realization in interactive graphical schematic editor of MICRO-PC circuit simulator // The Sixth International Conference The Experience of Designing and Application of CAD Systems in Microelectronics, February 12-17, 2001, Lviv-Slavsko, Ukraine.
- Vasyl Tesluk, Petro Granat, Orest Korbetskyy, Volodymyr Koval Some features of Monte-Carlo methods usage for IC manufacturing technological operation simulation // The Sixth International Conference The Experience of Designing and Application of CAD Systems in Microelectronics, February 12-17, 2001, Lviv-Slavsko, Ukraine.
- Irena Kazymyra, Mykola Blyzniuk, Ihor Farmaga Models of ICs Schematic Vulnerability to Local Temperatures: Development and Analysis // The Sixth International Conference The Experience of Designing and Application of CAD Systems in Microelectronics, February 12-17, 2001, Lviv-Slavsko, Ukraine.
- Andriy Kernytskyy, Mykhaylo Lobur, Jerzy Wrobel Modern approaches to engineering databases // The Sixth International Conference The Experience of Designing and Application of CAD Systems in Microelectronics, February 12-17, 2001, Lviv-Slavsko, Ukraine.
- Mykhaylo Lobur, Vitaliy Mazur, Ihor Farmaga Strategic planning and computer-aided design of organizational and technical systems // The Sixth International Conference The Experience of Designing and Application of CAD Systems in Microelectronics, February 12-17, 2001, Lviv-Slavsk, Ukraine.
- Volodymyr Karkuljovskyy, Ihor Motyka Technique simulation of complicated mechanical systems // The Sixth International Conference The Experience of Designing and Application of CAD Systems in Microelectronics, February 12-17, 2001, Lviv-Slavsko, Ukraine.
- Irena Kazymyra, Mykola Blyzniuk, Ihor Farmaga Previous estimation of the non-uniform temperature field influense on the Ics functioning //Proceedings of the 8th International Conference "Mixed Design of Integrated Circuits and Systems" (MIXDES'2001). Zakopane, Poland, 2001.
- M.Blyzniuk, I.Kazymyra, W.Kuzmicz, W.A.Pleskacz, J. Raik, R.Ubar Probabilistic analisis of CMOS physical defects in VLSI circuits for test coverage improvement // Microelectronics Reliability, Vol 41/12, 2001.
- M.Blyzniuk, I.Kazymyra Development of the special software tools for the defect/fault analisys in the complex gates from standard cell library// Proceedings of the 2001 IEEE International Simposium on Defect and Fault Tolerance in VLSI Systems (DFT'2001), IEEE Computer Society Press, San Francisco, California, USA, 2001.
- M.Blyzniuk, I.Kazymyra Estimation of Parametric Sensitivity for Defects Size Distribution in VLSI Defect/Fault Analysis //Proceedings of the 2002 IEEE 23rd International Conference on Microelectronics (MIEL 2002), Nis, Yugoslavia (accepted for publication).
- Andrij Kernytskyy, Mykhaylo Lobur "Omega LP" - Design and production date management system for small machine-bulding enterprise // XIII Konferencja nt - Metody I srodky projectovania wspomaganego komputerovo", Warszawa, listopad 2001.